X-ray phase-contrast topography to measure the surface stress and bulk strain in a silicon crystal
- 1 October 2020
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 53 (5), 1195-1202
- https://doi.org/10.1107/S1600576720009267
Abstract
No abstract availableKeywords
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