In search of convenient techniques for reducing bias in the estimation of Weibull parameters for uncensored tests
- 1 June 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Dielectrics and Electrical Insulation
- Vol. 4 (3), 306-313
- https://doi.org/10.1109/94.598287
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
- Unbiasing procedures for the Weibull distribution? Be carefulPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Bias and standard deviation due to Weibull parameter estimation for small data setsIEEE Transactions on Dielectrics and Electrical Insulation, 1996
- Comparison of maximum likelihood unbiasing methods for the estimation of the Weibull parametersIEEE Transactions on Dielectrics and Electrical Insulation, 1996
- Formulas to describe the bias and standard deviation of the ML-estimated Weibull shape parameterIEEE Transactions on Dielectrics and Electrical Insulation, 1994
- A reliable algorithm for the exact median rank functionIEEE Transactions on Electrical Insulation, 1993
- Generalization of the method of maximum likelihood (insulation testing)IEEE Transactions on Electrical Insulation, 1993
- Estimating the cumulative probability of failure data points to be plotted on Weibull and other probability paperIEEE Transactions on Electrical Insulation, 1990
- Simplified Statistical Procedures for the Weibull or Extreme-Value DistributionTechnometrics, 1977
- Inferences on the Parameters of the Weibull DistributionTechnometrics, 1969
- The Moments of Log-Weibull Order StatisticsTechnometrics, 1969