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Crystal Defects of Silicon Films Formed by Molecular Beam Epitaxy
Home
Publications
Crystal Defects of Silicon Films Formed by Molecular Beam Epitaxy
Crystal Defects of Silicon Films Formed by Molecular Beam Epitaxy
HS
Hideo Sugiura
Hideo Sugiura
MY
Masafumi Yamaguchi
Masafumi Yamaguchi
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1 April 1980
journal article
Published by
IOP Publishing
in
Japanese Journal of Applied Physics
Vol. 19
(4)
,
583-589
https://doi.org/10.1143/jjap.19.583
Abstract
No abstract available
Cited by 25 articles