The effect of the amorphous insulator layer on conduction behaviors of the silica/indium tin oxide two-layer films
- 1 August 2003
- journal article
- Published by Elsevier BV in Thin Solid Films
- Vol. 437 (1-2), 242-247
- https://doi.org/10.1016/s0040-6090(03)00681-3
Abstract
No abstract availableKeywords
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