The Identification of Precipitate Particles in Single Crystals of Silicon by Reflection Electron Diffraction
- 1 December 1960
- journal article
- Published by IOP Publishing in Proceedings of the Physical Society
- Vol. 76 (6), 993-996
- https://doi.org/10.1088/0370-1328/76/6/421
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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- CVI. The sensitivity of electron diffraction as a means of detecting thin surface films: IThe London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science, 1955