The identification of rhenium in tungsten-rhenium alloys using the field-ion microscope

Abstract

A series of tungsten—rhenium solid solution alloys have been examined using a helium field-ion microscope. The micrographs show that during field evaporation of these alloys the rhenium atoms are less readily removed by field evaporation and remain on the surface. The effect is most noticeable on the {011} net planes and explains the poor perfection of the field-evaporated end-form seen in the higher rhenium content tungsten-rhenium solid sloution alloys.