Thin films in vacuum ultraviolet spectroscopy
- 1 November 1972
- journal article
- Published by Elsevier BV in Thin Solid Films
- Vol. 13 (1), 143-156
- https://doi.org/10.1016/0040-6090(72)90166-6
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Choice of criteria for ellipsometric determinations on thin filmsThin Solid Films, 1972
- Critical assessment and modification of Robinson's method for the ellipsometric investigation of thin film materialsThin Solid Films, 1972
- Ellipsometric analysis of amorphous oxide film growth and crystalline oxide island development during thermal oxidation of aluminumThin Solid Films, 1972
- Determination of the optical constants of thin absorbing filmsThin Solid Films, 1972
- Ultraviolet Optical Constants of Thin Films Determined by Reflectance MeasurementsJournal of the Optical Society of America, 1970
- Constantes optiques et pouvoir réflecteur de couches minces de fluorures dans l'ultraviolet lointainJournal de Physique, 1964
- On the optical constants of metals at wavelengths shorter that their critical wavelengthsJournal de Physique, 1964
- Interference Transmission Filters for the Far Ultraviolet*Journal of the Optical Society of America, 1962
- Induced Transmission in Absorbing Films Applied to Band Pass Filter DesignJournal of the Optical Society of America, 1957
- The Design of Optical FiltersJournal of the Optical Society of America, 1952