Grazing Incidence X-ray Diffraction Studies of Thin Films Using an Imaging Plate Detection System
- 1 January 1996
- journal article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 12 (3), 774-777
- https://doi.org/10.1021/la950454n
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- The two-dimensional hexatic-B phase of single Langmuir-Blodgett monolayers observed by atomic force microscopyThin Solid Films, 1994
- Structures of fatty acid monolayers transferred to glass substrates from various Langmuir monolayer phasesLangmuir, 1993
- Quantitative lattice measurement of thin Langmuir-Blodgett films by atomic-force microscopyPhysical Review E, 1993
- Thickness and temperature dependent structure of Cd arachidate Langmuir-Blodgett filmsThin Solid Films, 1992
- The Australian diffractometer at the Photon FactoryReview of Scientific Instruments, 1992
- Imaging plate ‐ X‐ray area detector based on photostimulable phosphorSynchrotron Radiation News, 1990
- Bond-orientational order in Langmuir-Blodgett surfactant monolayersJournal de Physique, 1986
- Study of in-plane structure in lead-fatty acid LB films using X-ray diffractionThin Solid Films, 1985