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Accelerated Testing in FAMOS Devices - 8K EPROM
Home
Publications
Accelerated Testing in FAMOS Devices - 8K EPROM
Accelerated Testing in FAMOS Devices - 8K EPROM
RA
Robert M. Alexander
Robert M. Alexander
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1 April 1978
conference paper
conference paper
Published by
Institute of Electrical and Electronics Engineers (IEEE)
in
8th Reliability Physics Symposium
https://doi.org/10.1109/irps.1978.362851
Abstract
No abstract available
Keywords
SYSTEM TESTING
EPROM
TEMPERATURE
Cited by 8 articles