High Resolution X-Ray Scattering Measurements For The Advanced X-Ray Astrophysics Facility (AXAF)
- 1 February 1982
- journal article
- Published by SPIE-Intl Soc Optical Eng in Optical Engineering
- Vol. 21 (1), 210016-210016-
- https://doi.org/10.1117/12.7972860