Thickness dependence of the electrical resistivity of epitaxially grown silver films
- 1 May 1981
- journal article
- Published by Elsevier BV in Thin Solid Films
- Vol. 79 (2), 193-199
- https://doi.org/10.1016/0040-6090(81)90278-9
Abstract
No abstract availableKeywords
This publication has 32 references indexed in Scilit:
- The size effect in the thermoelectric power of silver filmsThin Solid Films, 1977
- Resistivity of polycrystalline silver filmsphysica status solidi (a), 1975
- Resistivity and thermoelectric power between -100 °C and +100 °C of gold and silver thin films formed and studied in ultrahigh vacuumThin Solid Films, 1974
- Thermoelectric power of thin silver filmsJournal of Applied Physics, 1973
- Geometrical size effect in polycrystalline silver filmsThin Solid Films, 1972
- Geometrical Size Effect in Resistivity and Hall Coefficient in Single-Crystal Silver FilmsJournal of Applied Physics, 1971
- SIZE EFFECT IN THIN SINGLE-CRYSTAL SILVER FILMSApplied Physics Letters, 1968
- Verification of the Anomalous-Skin-Effect Theory for Silver in the InfraredPhysical Review B, 1968
- Hall Effect in Thin Metal FilmsJournal of Applied Physics, 1967
- ELECTRICAL RESISTIVITY OF THIN EPITAXIALLY GROWN SILVER FILMSApplied Physics Letters, 1964