High resolution cold stage for the JEOL 100B and 100C electron microscopes
- 1 January 1980
- journal article
- research article
- Published by Elsevier BV in Ultramicroscopy
- Vol. 5 (1-3), 3-8
- https://doi.org/10.1016/0304-3991(80)90005-4
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
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