Statistical control and optimization of X-ray intensity measurements
- 21 April 1977
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 10 (6), 817-830
- https://doi.org/10.1088/0022-3727/10/6/004
Abstract
When used to determine the concentrations of chemical elements in samples, X-ray intensity measurements are processed by correction programmes. These measurements are now usually obtained with fully or partially automated instruments. In order to suppress useless computations on sets of results containing rogue values, statistical tests must first be applied to the original experimental data. From an economic standpoint, it may also be worthwhile to reject the outlying counts automatically rather than discard complete sets of measurements. Statistical tests permitting the detection of outliers in groups of results are described.Keywords
This publication has 18 references indexed in Scilit:
- Extension of Sample Sizes and Percentage Points for Significance Tests of Outlying ObservationsTechnometrics, 1972
- Statistical error calculation of experimental concentration electron probe microanalysisMetallography, 1972
- Investigation of Rules for Dealing With Outliers in Small Samples from the Normal Distribution: I: Estimation of the MeanTechnometrics, 1969
- Procedures for Detecting Outlying Observations in SamplesTechnometrics, 1969
- Precision of Fixed-Time vs. Fixed-Count Measurements.Analytical Chemistry, 1962
- Precision in X-Ray Spectrochemical Analysis. Fixed-Time vs. Fixed-Count.Analytical Chemistry, 1962
- Rules for Rejection of OutliersRevue de l'Institut International de Statistique / Review of the International Statistical Institute, 1961
- Processing Data for OutliersBiometrics, 1953
- Ratios Involving Extreme ValuesThe Annals of Mathematical Statistics, 1951
- Sample Criteria for Testing Outlying ObservationsThe Annals of Mathematical Statistics, 1950