On the feasibility ofin situobservations of recrystallization in the high voltage electron microscope

Abstract

A model explaining the inhibition of recrystallization in the thinner regions of specimens annealed directly in the electron microscope is presented.By using this treatment combined with suitable electron microscope observations, it is shown that nucleation and growth of new recrystallized grains is qualitatively characteristic of bulk material in those areas of copper specimens thicker than about 4500 A. Such thicknesses are penetrated only with difficulty by 100 kev electrons but are readily accessible with a million volt microscope.