Fuzzy states as a basis for a theory of fuzzy reliability
- 1 December 1993
- journal article
- research article
- Published by Elsevier BV in Microelectronics Reliability
- Vol. 33 (15), 2253-2263
- https://doi.org/10.1016/0026-2714(93)90065-7
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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