Uncertainty analysis for noise-parameter measurements
- 1 June 2008
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of the noise correlation matrix, and the traditional IEEE noise parameters.Keywords
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