Resin development for electron microscopy and an analysis of embedding at low temperature*
- 1 May 1982
- journal article
- research article
- Published by Wiley in Journal of Microscopy
- Vol. 126 (2), 123-143
- https://doi.org/10.1111/j.1365-2818.1982.tb00362.x
Abstract
No abstract availableThis publication has 39 references indexed in Scilit:
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