Ionic transport in amorphous anodic titania stabilised by incorporation of silicon species
- 31 May 2002
- journal article
- Published by Elsevier BV in Corrosion Science
- Vol. 44 (5), 1047-1055
- https://doi.org/10.1016/s0010-938x(01)00111-1
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- Influence of tungsten species on the structure of anodic titaniaPhilosophical Magazine A, 1998
- Inter–relationships between ionic transport and composition in amorphous anodic oxidesProceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, 1997
- Anodic film formation on a sputter-deposited amorphous Al–40 at. % Sm alloyJournal of Materials Research, 1997
- A Model for the Incorporation of Electrolyte Species into Anodic AluminaJournal of the Electrochemical Society, 1996
- A novel marker approach for the determination of transport numbers during the growth of anodic oxide films on tantalumPhilosophical Magazine A, 1995
- Models for Ionic Conduction in Anodic Oxide FilmsJournal of the Electrochemical Society, 1979
- A Rutherford Backscattering Analysis of Anodic Tantalum‐Titanium OxidesJournal of the Electrochemical Society, 1976
- The Use of Rutherford Backscattering to Study the Behavior of Ion-Implanted Atoms During Anodic Oxidation of Aluminum: Ar, Kr, Xe, K, Rb, Cs, Cl, Br, and lJournal of the Electrochemical Society, 1973
- Transport Numbers of Metal and Oxygen during the Anodic Oxidation of TantalumJournal of the Electrochemical Society, 1973
- Electrolytic breakdown crystallization of anodic oxide films on A1, Ta and TiElectrochimica Acta, 1970