Difference in the CrL3L2Intensity Ratio Measured by Soft-X-Ray and Auger-Electron Appearance-Potential Spectroscopy

Abstract

The $\frac{L_3}{L_2}$ radiative intensity ratio measured by soft-x-ray appearance-potential spectrum (SXAPS) techniques for a clean Cr surface is approximately unity. The Auger-electron appearance-potential spectrum data on the total Auger-electron yield show the expected statistical weighting ratio of 2. It is concluded that a radiative transition to a $2p_{\frac{1}{2}}$ hole is twice as likely as to a $2p_{\frac{3}{2}}$ hole. SXAPS $\frac{L_3}{L_2}$ ratios should provide a sensitive test for models of the electronic structure of surface atoms.