Quantitative Microprobe Analysis by Means of Target Current Measurements
- 1 January 1967
- book chapter
- Published by Springer Science and Business Media LLC
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Contribution of Backscattered Electrons to Secondary Electron FormationPhysical Review B, 1961
- Theory of Secondary EmissionPhysical Review B, 1957
- Secondary Electron Emission and Atomic Shell StructurePhysical Review B, 1950
- A Theory of Secondary Electron Emission from MetalsPhysical Review B, 1950
- Secondary electron emissionPhysica, 1938