Using target faults to detect non-target defects
- 23 December 2002
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 629-638
- https://doi.org/10.1109/test.1996.557120
Abstract
The traditional ATPG method relies upon faults to target all defects. Since faults do not model all possible defects, testing quality depends on the fortuitous detection of non-target defects. By analyzing different ATPG approaches, this paper intends to identify critical factors that may greatly affect the fortuitous detection. For enhancing the fortuitous detection of non-target defects through target faults, new concepts and novel ATPG methods are proposed.Keywords
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