Fault Detection Based on Statistical Multivariate Analysis and Microarray Visualization
- 4 September 2009
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Industrial Informatics
- Vol. 6 (1), 18-24
- https://doi.org/10.1109/tii.2009.2030793
Abstract
In this work, a statistical method is proposed to mine out key variables from a large set of variables recorded in a limited number of runs through a multistage multistep manufacturing process. The method employed well-known single variable or multivariable techniques of discrimination and regression but also presented a synopsis of analysis results in a colored map of p-values very similar to a DNA microarray. This framework provides a systematic method of drawing inferences from the available evidence without interrupting the normal process operation. The proposed concept is illustrated by two industrial examples.Keywords
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