Radiative and non-radiative recombination in amorphous silicon

Abstract
A model is presented for recombination in amorphous silicon, the essentials of which are: The fundamental electronic excitation with the lowest energy consists of a trapped electron bound to a trapped hole by Coulombic attraction. This concept is supported by the observation that an electric field in the range of 107Vm−1 is able to quench photoluminescence, and by other luminescence and photoconductivity results.