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Comparison of Early Generation Yield Testing and a Single Seed Descent Procedure in Wheat Breeding
Home
Publications
Comparison of Early Generation Yield Testing and a Single Seed Descent Procedure in Wheat Breeding
Comparison of Early Generation Yield Testing and a Single Seed Descent Procedure in Wheat Breeding
DK
D. R. Knott
D. R. Knott
JK
J. Kumar
J. Kumar
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1 May 1975
journal article
Published by
Wiley
in
Crop Science
Vol. 15
(3)
,
295-299
https://doi.org/10.2135/cropsci1975.0011183x001500030004x
Abstract
No abstract available
Keywords
BREEDING
WHEAT
SEED
PROCEDURE
SSD
HIGHEST
YIELD TESTED
Cited by 59 articles