Thin thickness measurements by means of a wavelet transform-based method
- 30 April 1997
- journal article
- Published by Elsevier BV in Measurement
- Vol. 20 (4), 227-242
- https://doi.org/10.1016/s0263-2241(97)00035-3
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
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