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Hot-Carrier Reliability of MOS VLSI Circuits
Home
Publications
Hot-Carrier Reliability of MOS VLSI Circuits
Hot-Carrier Reliability of MOS VLSI Circuits
YL
Yusuf Leblebici
Yusuf Leblebici
SK
Sung-Mo Kang
Sung-Mo Kang
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1 January 1993
book
Published by
Springer Science and Business Media LLC
https://doi.org/10.1007/978-1-4615-3250-7
Abstract
No abstract available
Keywords
LEISTUNGSFELDEFFEKTTRANSISTOR
MOSFET
VLSI
CIRCUIT
DIAGNOSIS
FIELD-EFFECT TRANSISTOR
METAL OXIDE SEMICONDUCTUR FIELD-EFFECT TRANSISTOR
MODELING
PHYSICS
SIMULATION
TRANSISTOR
Cited by 49 articles