Probing Soft Matter with the Atomic Force Microscopies: Imaging and Force Spectroscopy

Abstract

The development of atomic force microscopy has evolved into a wide variety of microscopy and characterization techniques well beyond conventional imaging. The focus of this review is on characterization methods based on the scanning probe and their application in characterizing physical properties of soft materials. This consideration is broken into three major categories focusing on mechanical, thermal, and electrical/magnetic properties in addition to a brief review of high-resolution imaging. Surface spectroscopy is discussed to great extent and consideration includes procedural information, common pitfalls, capabilities, and their practical application in characterizing soft matter. Key examples of the method are presented to communicate the capabilities and impact that probe-based characterization techniques have had on the mechanical, thermal, and electrical characterization of soft materials.