Test of McWhorter's model of low-frequency noise in Si MOSTs
- 1 December 1971
- journal article
- Published by Elsevier BV in Microelectronics Reliability
- Vol. 10 (6), 429-433
- https://doi.org/10.1016/0026-2714(71)90101-6
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Theory of low frequency noise in Si MOST'sSolid-State Electronics, 1970
- Low frequency noise in MOS transistors—I TheorySolid-State Electronics, 1968
- Low frequency noise in MOS field effect transistorsSolid-State Electronics, 1967
- Evidence of the Surface Origin of theNoisePhysical Review Letters, 1966