Reliability studies of vertical GaN devices based on bulk GaN substrates
- 1 August 2015
- journal article
- Published by Elsevier BV in Microelectronics Reliability
- Vol. 55 (9-10), 1654-1661
- https://doi.org/10.1016/j.microrel.2015.07.012
Abstract
No abstract availableFunding Information
- U.S. ARPA-E SWITCHES (DE-AR0000449)
- U.S. Office of Naval Research (N122-135-0058)
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