Charge centroid and trapping model for MNOS structures

Abstract

Charge centroid, trap density, and capture cross section for an MNOS structure are derived from measurements of the change in flat band voltage with varying pulse duration and temperature using the Arnett‐Yun model. The temperature dependence of these parameters suggests that the Arnett‐Yun model for the initial space‐charge buildup is not entirely valid. The observations are in qualitative agreement with partially ionized traps whose occupancy by electrons decreases with increasing temperature and electric field.