CHANNEL PLATE IMAGE CONVERTER IN ARGON FIELD-ION MICROSCOPY
- 1 December 1969
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 15 (11), 384-385
- https://doi.org/10.1063/1.1652869
Abstract
A field‐ion microscope utilizing an internal channel plate ion‐to‐electron converter is described and some results with He and Ar are presented. The device is shown to have excellent resolution, and a gain of ∼ 103 for He and ∼ 102 for Ar, relative to unintensified He micrographs. Good imaging of clean W surfaces can be achieved at 2 V/Å by using ultrapure Ar and ultrahigh vacuum; Ar imaging of adsorbed impurities occurs at 1.7 V/Å.Keywords
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- Field Ion Microscopy with an External Image IntensifierReview of Scientific Instruments, 1964
- Operation of the Field Ion Microscope with NeonJournal of Applied Physics, 1964
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