XRD, TEM, IR and 29Si MAS NMR characterization of NiO-SiO2 nanocomposites
- 1 January 2001
- journal article
- Published by Springer Science and Business Media LLC in Journal of Materials Science
- Vol. 36 (15), 3731-3735
- https://doi.org/10.1023/a:1017973716834