Charge collection and noise analysis of heavily irradiated silicon detectors
- 1 April 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 45 (2), 141-145
- https://doi.org/10.1109/23.664165
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- Study of charge collection and noise in non-irradiated and irradiated silicon detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1997
- Long term damage studies using silicon detectors fabricated from different starting materials and irradiated with neutrons, protons, and pionsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1996
- Radiation damage in silicon detectorsLa Rivista del Nuovo Cimento, 1994
- Pion induced displacement damage in silicon devicesNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1993