Lateral forces and topography using scanning tunneling microscopy with optical sensing of the tip position
- 27 February 1989
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 54 (9), 801-803
- https://doi.org/10.1063/1.100851
Abstract
A technique is described for measurement of lateral forces on a scanning tunneling microscopy (STM) tip simultaneously with surface topography, using optical sensing of the STM tip vibration. The STM tip is caused to vibrate near a resonant mode in the lateral direction, using the capacitive forces between the tip and the surface under study. Topography is monitored using the z-displacement feedback voltage, in a low-frequency loop, while optical sensing of the high-frequency tip vibration amplitude monitors lateral forces acting on the tip.Keywords
This publication has 7 references indexed in Scilit:
- Novel optical approach to atomic force microscopyApplied Physics Letters, 1988
- High-resolution capacitance measurement and potentiometry by force microscopyApplied Physics Letters, 1988
- Atomic-scale friction of a tungsten tip on a graphite surfacePhysical Review Letters, 1987
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987
- Experimental Observation of Forces Acting during Scanning Tunneling MicroscopyPhysical Review Letters, 1986
- Atomic Force MicroscopePhysical Review Letters, 1986
- 7 × 7 Reconstruction on Si(111) Resolved in Real SpacePhysical Review Letters, 1983