Diffraction spot profile analysis for heteroepitaxial surfaces applied to the initial growth stages of CaF2 adlayers on Si(111)
- 1 September 1996
- journal article
- Published by Elsevier BV in Applied Surface Science
- Vol. 104-105, 392-401
- https://doi.org/10.1016/s0169-4332(96)00177-8
Abstract
No abstract availableKeywords
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