Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlation
- 25 September 2010
- journal article
- Published by Elsevier BV in Surface and Coatings Technology
- Vol. 205 (7), 2393-2403
- https://doi.org/10.1016/j.surfcoat.2010.09.033
Abstract
No abstract availableKeywords
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