Growth and characterization of PMNT relaxor-based ferroelectric single crystals by flux method
- 15 January 2003
- journal article
- Published by Elsevier BV in Materials Science and Engineering B
- Vol. 99 (1-3), 183-186
- https://doi.org/10.1016/s0921-5107(02)00486-5
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Effect of Lead Content on the Structure and Electrical Properties of Pb((Zn1/3Nb2/3)0.5(Zr0.47Ti0.53)0.5)O3 CeramicsJournal of the American Ceramic Society, 2001
- Structural defects of Pb(Mg1/3Nb2/3)O3–PbTiO3 single crystals grown by a Bridgman methodJournal of Crystal Growth, 2001
- High-temperature solution growth and characterization of the piezo-/ferroelectric (1−x)Pb(Mg1/3Nb2/3)O3–xPbTiO3 [PMNT] single crystalsJournal of Crystal Growth, 2000
- Ultrahigh strain and piezoelectric behavior in relaxor based ferroelectric single crystalsJournal of Applied Physics, 1997
- Relaxor based ferroelectric single crystals for electro-mechanical actuatorsMaterials Research Innovations, 1997
- Dielectric behavior of single crystals near the (1−X) Pb(Mg1/3Nb2/3)O3-(x) PbTiO3morphotropic phase boundaryFerroelectrics Letters Section, 1990
- Flux growth and characterization of single crystals of the perovskites Pb2FeTaO6 and Pb2CoWO6Journal of Crystal Growth, 1987
- Dielectric and Piezoelectric Properties of 0.91Pb(Zn1/3Nb2/3)O3-0.09PbTiO3 Single CrystalsJapanese Journal of Applied Physics, 1982