Millimeter-wave surface resistance measurements in highly orientedthin films
- 1 June 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 37 (16), 9726-9729
- https://doi.org/10.1103/physrevb.37.9726
Abstract
We have measured the temperature dependence of the millimeter-wave surface resistance in two oriented polycrystalline thin-film samples of . Below 80 K, drops rapidly as the temperature is decreased as expected for a superconductor, but excess surface resistance is observed at low temperatures in contrast to the predictions of the Bardeen-Cooper-Schrieffer theory. The measured temperature, frequency, and orientation dependence of the surface resistance are presented and discussed.
Keywords
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