Use of Secondary Ion Mass Spectrometry in Nuclear Forensic Analysis for the Characterization of Plutonium and Highly Enriched Uranium Particles
- 10 June 1999
- journal article
- research article
- Published by American Chemical Society (ACS) in Analytical Chemistry
- Vol. 71 (14), 2616-2622
- https://doi.org/10.1021/ac981184r
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Application of secondary ion mass spectrometry to the identification of single particles of uranium and their isotopic measurementSpectrochimica Acta Part B: Atomic Spectroscopy, 1998
- Nuclear and Radiochemistry: Fundamentals and ApplicationsPublished by Wiley ,1997
- Analytical chemistry in the aftermath of the Gulf WarAnalytical Chemistry, 1993