DENSITY OF SiO2–Si INTERFACE STATES
- 15 January 1966
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 8 (2), 31-33
- https://doi.org/10.1063/1.1754468
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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- Ion Transport Phenomena in Insulating FilmsJournal of Applied Physics, 1965
- Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structuresSolid-State Electronics, 1965
- An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodesSolid-State Electronics, 1962
- Some effects of material parameters on the design of surface space-charge varactorsSolid-State Electronics, 1961
- Surface States on Silicon and Germanium SurfacesPhysical Review B, 1957
- Surface States on Silicon and Germanium SurfacesPhysical Review B, 1956