The Berkeley reliability simulator BERT: an IC reliability simulator
- 30 April 1992
- journal article
- Published by Elsevier BV in Microelectronics Journal
- Vol. 23 (2), 97-102
- https://doi.org/10.1016/0026-2692(92)90041-x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Projecting interconnect electromigration lifetime for arbitrary current waveformsIEEE Transactions on Electron Devices, 1990
- Probabilistic simulation for reliability analysis of CMOS VLSI circuitsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1990
- An integrated-circuit reliability simulator-RELYIEEE Journal of Solid-State Circuits, 1989
- RELIANT: a reliability analysis tool for VLSI interconnectIEEE Journal of Solid-State Circuits, 1989
- Modeling and characterization of gate oxide reliabilityIEEE Transactions on Electron Devices, 1988