High resolution X-ray diffraction from small numbers of Langmuir-Blodgett layers of manganese stearate
- 1 May 1980
- journal article
- Published by Elsevier BV in Thin Solid Films
- Vol. 68 (1), 33-45
- https://doi.org/10.1016/0040-6090(80)90134-0
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Preparation of Literally Two-Dimensional MagnetsPhysical Review Letters, 1978
- Structure study of multilayer assembly filmsJournal of Applied Physics, 1977
- X-ray diffraction study of a one-dimensional GaAs–AlAs superlatticeJournal of Applied Crystallography, 1977
- Smooth and coherent layers of GaAs and AlAs grown by molecular beam epitaxyApplied Physics Letters, 1976
- X-ray diffraction from fatty-acid multilayers. Angular width of reflexions from systems with few unit cellsActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1974
- Observation of X-ray interferences on thin films of amorphous siliconThin Solid Films, 1973
- X-Ray Interference Structure in the Scattered Radiation from Barium Stearate Multilayer FilmsPhysical Review B, 1965
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954
- Interferenz von Röntgenstrahlen an dünnen SchichtenAnnalen der Physik, 1931
- CXVII. The total reflexion of X-raysThe London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science, 1923