X-ray wavefront analysis and optics characterization with a grating interferometer
- 24 January 2005
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 86 (5), 054101
- https://doi.org/10.1063/1.1857066
Abstract
We present an interferometric method to measure the shape of a hard-x-ray wavefront. The interferometer consists of a phase grating as a beam splitter and an absorption grating as a transmission mask for the detector. The device can be used to measure wavefront shape gradients corresponding to radii of curvature as large as several dozens of meters, with a lateral resolution of a few microns. This corresponds to detected wavefront distortions of approximately or . The device was used with 12.4 keV x rays to measure the slope error and height profile of an x-ray mirror. Surface slope variations with periods ranging from less than 1 mm to more than 1 m can be detected with an accuracy better than .
Keywords
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