Microprobing of functioning semiconductor devices for internal voltage and current distributions
- 30 April 1962
- journal article
- Published by Elsevier BV in Solid-State Electronics
- Vol. 5 (2), 89-IN16
- https://doi.org/10.1016/0038-1101(62)90021-7
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Size Reduction.Industrial & Engineering Chemistry, 1959
- Design Theory of Junction TransistorsBell System Technical Journal, 1953