Experiments on intrinsic and thermally induced chaos in an rf-driven Josephson junction
- 1 April 1986
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 33 (7), 5127-5130
- https://doi.org/10.1103/physrevb.33.5127
Abstract
We report detailed measurements of low-frequency noise due to microwaves applied to a real Josephson tunnel junction. An intrinsically chaotic region is apparently identified, but the effects of thermal noise are shown to be significant. In particular we show experimental data that we interpret as evidence for thermally activated hopping and thermally affected chaos. The data are only in qualitative accord with recent ideas regarding the effect of thermal noise on intermittent chaos.Keywords
This publication has 14 references indexed in Scilit:
- Chaos and thermal noise in the rf-biased Josephson junctionJournal of Applied Physics, 1985
- Intermittent Chaos and Low-Frequency Noise in the Driven Damped PendulumPhysical Review Letters, 1985
- Survey of chaos in the rf-biased Josephson junctionJournal of Applied Physics, 1985
- Structures on Josephson current-steps, bifurcation and chaosPhysics Letters A, 1984
- Studies of the intermittent-type chaos in ac- and dc-driven Josephson junctionsPhysical Review B, 1984
- Simulation of the noise rise in three-photon Josephson parametric amplifiersApplied Physics Letters, 1983
- Chaos in Josephson circuitsIEEE Transactions on Magnetics, 1983
- Chaotic states and routes to chaos in the forced pendulumPhysical Review A, 1982
- Chaos and noise rise in Josephson junctionsApplied Physics Letters, 1981
- Noise phenomena in Josephson junctionsApplied Physics Letters, 1980