Extraction of phase data from electronic speckle pattern interferometric fringes using a single-phase-step method: a novel approach

Abstract

A new technique has been developed for extracting both deformation and shape information from electronic speckle pattern interferometry fringes that involves a significant improvement in environmental stability and reduced computational effort. This new approach utilizes a single-phase-step technique to extract data and requires no additional optical components to produce a rapid analysis of static and dynamic fringe patterns. Continuous-wave, stroboscopic, and pulsed laser illumination are all amenable to this technique. Comparisons are made with similar phase-reduction techniques involving two and three phase steps. It is concluded that there is not a significant difference among these and hence that the new technique offers important practical advantages. Results are presented from the analysis of static and dynamic targets.