High-throughput measurements of materials properties
- 13 March 2011
- journal article
- Published by Springer Science and Business Media LLC in JOM
- Vol. 63 (3), 40-44
- https://doi.org/10.1007/s11837-011-0044-z
Abstract
No abstract availableKeywords
This publication has 24 references indexed in Scilit:
- THE DIFFUSION-MULTIPLE APPROACH TO DESIGNING ALLOYSAnnual Review of Materials Research, 2005
- Thermal Conductivity Imaging of Thermal Barrier CoatingsAdvanced Engineering Materials, 2005
- Analysis of heat flow in layered structures for time-domain thermoreflectanceReview of Scientific Instruments, 2004
- Reliability of the diffusion-multiple approach for phase diagram mappingJournal of Materials Science, 2004
- Thermal conductivity imaging at micrometre-scale resolution for combinatorial studies of materialsNature Materials, 2004
- A diffusion-multiple approach for mapping phase diagrams, hardness, and elastic modulusJOM, 2002
- A combinatorial approach for efficient mapping of phase diagrams and propertiesJournal of Materials Research, 2001
- A Combinatorial Approach for Structural MaterialsAdvanced Engineering Materials, 2001
- An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experimentsJournal of Materials Research, 1992
- Microtexture determination by electron back-scatter diffractionJournal of Materials Science, 1992