Characterization of X-ray Induced Damage in Alkanethiolate Monolayers by High-Resolution Photoelectron Spectroscopy
- 9 December 2000
- journal article
- research article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 17 (1), 8-11
- https://doi.org/10.1021/la001101d
Abstract
No abstract availableKeywords
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