ATR/FT-IR Study of Vanadium Pentoxide Gel Films on Semiconductor Substrates
- 1 September 1995
- journal article
- research article
- Published by SAGE Publications in Applied Spectroscopy
- Vol. 49 (9), 1279-1281
- https://doi.org/10.1366/0003702953965335
Abstract
Deposition of the vanadium pentoxide on a KRS-5 ATR crystal by dip-coating has led to the formation of a thallium bronze. ATR spectroscopy is used to study the changes in the spectral pattern induced by the heat treatment of the films. The results show that both the spectrum of the xerogel and its evolution depend on the precursors and the method of preparation. The spectra of the heated thin films suggest an irreversible structural change taking place at a temperature around 220°C.Keywords
This publication has 15 references indexed in Scilit:
- Metal insertion from solid substrates in sol-gel derived vanadium pentoxide thin filmsSolid State Ionics, 1994
- Study of amorphous and crystalline Li1+xV3O8 by FTIR, XAS and electrochemical techniquesSolid State Ionics, 1992
- Electrochromic properties of vanadium pentoxide thin films prepared by new wet processApplied Physics Letters, 1992
- Electrochemically lithiated V2O5 films: An optically passive ion storage for transparent electrochromic devicesJournal of Materials Research, 1990
- Synthesis and Characterization of Vanadium Oxide Gels from Alkoxy-Vanadate PrecursorsMRS Proceedings, 1988
- Low temperature reactive sputter deposition of vanadium oxideJournal of Vacuum Science & Technology A, 1985
- Structural study of gels of V2O5: Vibrational spectra of xerogelsJournal of Solid State Chemistry, 1985
- Determination of the optical constants and thickness of amorphous V2O5 thin filmsThin Solid Films, 1983
- Condensation process in polyvanadic acid solutionsJournal of Inorganic and Nuclear Chemistry, 1980
- Lithium incorporation by vanadium pentoxideInorganic Chemistry, 1979