High-pressure–low-temperature x-ray power diffractometer
- 1 August 1978
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 49 (8), 1107-1111
- https://doi.org/10.1063/1.1135529
Abstract
A high-pressure technique for x-ray diffraction studies at low temperatures is described. The system consists of a Bridgman anvil type high-pressure device with either tungsten carbide or boron carbide anvils, a liquid He cryostat, and x-ray diffractometer operating in Debye-Scherrer geometry. The newly developed boron carbide anvil cell is capable of containing a liquid pressure transmitting medium. The precision of the lattice parameter determination is discussed and the effect of nonisostatic stress components on the diffraction pattern is examined.Keywords
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